A standardized approach to characterize hysteresis in 2D-materials-based transistors for stability benchmarking and performance projection
- Alexander Karl
- Axel Verdianu
- Dominic Waldhoer
- Theresia Knobloch
- Joël Kurzweil
- Mina Bahrami
- Mohammad Rasool Davoudi
- Pedram Khakbaz
- Bernhard Stampfer
- Seyed Mehdi Sattari-Esfahlan
- Yury Illarionov
- Aftab Nazir
- Changze Liu
- Yu Zheng
- Lorenzo Pettorosso
- Dmitry Polyushkin
- Thomas Müller
- Saptarshi Das
- Xiao Renshaw Wang
- Junchuan Tang
- Yichi Zhang
- Congwei Tan
- Ye Li
- Hailin Peng
- Michael Waltl
- Tibor Grasser
2025-11-21