Revealing interfacial failure mechanism of silicon based all solid state batteries via cryogenic electron microscopy
- Jingming Yao
- Zhixuan Yu
- Jun Ma
- Zhangran Ye
- Congcong Du
- Jun Zhao
- Jingzhao Chen
- Hongjun Ye
- Qiushi Dai
- Hui Li
- Yong Su
- Jitong Yan
- Dingding Zhu
- Zaifa Wang
- Xuedong Zhang
- Zhaoyu Rong
- Qiang Yu
- Ziang Guo
- Hailong Qiu
- Zhenyu Wang
- Lingyun Zhu
- Yongfu Tang
- Jianyu Huang
2025-11-04