Twinning mediated intralayer frustration governs structural degradation in layered Li-rich oxide cathode
- Tingting Yang
- Maolin Yang
- Zhongyuan Huang
- Rui Wang
- Wenhai Ji
- Peng-Han Lu
- Tao Zeng
- Zenan Li
- Jun Wang
- Rafal E. Dunin-Borkowski
- Lei Jin
- Yinguo Xiao
2025-07-17